![](https://congressarchive.cimne.com/sim-am_2023/assets/logo-sim-am-03_00000002.jpg)
IS02 - Benchmarking AM Simulations Through Physical Measurements I
Corresponding Organizer: Prof. Brandon Lane (NIST)
Chaired by:
Prof. Brandon Lane (NIST , United States)
Prof. Brandon Lane (NIST , United States)
Scheduled presentations:
-
Keynote
High-fidelity Modeling of Additive Manufacturing: Process, Microstructure, and Property
W. Yan* -
Providing a Rigorous Benchmark Measurement Foundation for the AM Modelling Community
L. Levine*, B. Lane, T. Phan, M. Stoudt, M. Williams -
The ExaAM Challenge Problem: Additive Manufacturing Modeling Guided by Experiment
J. Belak*, M. Bement -
Metal 3D Builds and In-situ Measurements for the 2022 Additive Manufacturing Benchmark Challenges
B. Lane*, H. Yeung, D. Deisenroth, S. Mekhontsev, L. Levine, T. Phan -
Overview of PBF-L Inconel 625 Mechanical Measurement Datasets from AM Bench 2022
N. Hrabe*, R. Carson, D. Pagan, S. Habib, J. Weaver, J. Benzing, L. Liew, N. Moser, O. Kafka, N. Derimow -
Voxel Scale Data and Machine Learning Predictions for Vat Photopolymerization Additive Manufacturing
J. Killgore*