Scheduled presentations:

• Keynote High-fidelity Modeling of Additive Manufacturing: Process, Microstructure, and Property
  *W. Yan (National University of Singapore)
• Providing a Rigorous Benchmark Measurement Foundation for the AM Modelling Community
  *L. Levine (NIST), B. Lane (NIST), T. Phan (LLNL), M. Stoudt (NIST), M. Williams (NIST)
• The ExaAM Challenge Problem: Additive Manufacturing Modeling Guided by Experiment
  *J. Belak (Lawrence Livermore National Laboratory), M. Bement (Oak Ridge National Laboratory)
• Metal 3D Builds and In-situ Measurements for the 2022 Additive Manufacturing Benchmark Challenges
  *B. Lane (NIST), H. Yeung (NIST), D. Deisenroth (NIST), S. Mekhontsev (NIST), L. Levine (NIST), T. Phan (LLNL)
• Overview of PBF-L Inconel 625 Mechanical Measurement Datasets from AM Bench 2022
  *N. Hrabe (National Institute of Standards and Technolog), R. Carson (Lawrence Livermore National Laboratory), D. Pagan (Penn State University), S. Habib (National Institute of Standards and Technolog), J. Weaver (National Institute of Standards and Technolog), J. Benzing (National Institute of Standards and Technolog), L. Liew (National Institute of Standards and Technolog), N. Moser (National Institute of Standards and Technolog), O. Kafka (National Institute of Standards and Technolog), N. Derimow (National Institute of Standards and Technolog)
• Voxel Scale Data and Machine Learning Predictions for Vat Photopolymerization Additive Manufacturing
  *J. Killgore (NIST)