IS07 - Multi-physics and Multi-scale Modelling Approaches in Additive Manufacturing
Additive manufacturing transforms the computer aided virtual design into the physical
functioning part through adding layers of material to form the final 3D product. With the vast
pool of methodologies, it has paved its way into several industrial applications. Currently the
AM industry faces the challenge of predicting the quality of the final product based on the
process parameters and foreseeing potential defects. An experimental trial and error approach
is clearly extravagantly expensive. Therefore, simulation has been adopted as an effective,
inexpensive and reliable tool to address this issue. Over and above that, using simulations and
experimental data, we are able to develop digital twins that guide the AM process and
determine the optimal process window in real-time. An AM process consists of many subprocesses that each have their own set of physical phenomena and operate at different
temporal and spatial scales. Consequently, an AM digital twin is powered by a number of submodels that represent different physics and scales. This multi-scale multi-physics approach
poses a challenge to establish correlations between disparate models. This mini symposia gives
the opportunity to bring together the researchers from diverse backgrounds working on
different aspects of multi-physics and multi-scale modelling in AM process simulation.
Moreover it also provides the platform to present and exchange the ideas in the framework of
scale bridging techniques for AM Technology. The following topics are included but are not
limited to:
Model order reduction / Reduced order modelling
Data-driven and physics-driven surrogate models
Scale bridging techniques e.g. homogenization, projection, coarse-graining etc.
Process-structure-property relationship
Validation, verification and uncertainty quantification (VVUQ)
Continuum-Discrete Coupling e.g. Lagrangian-Eulerian approaches
Micro-macro coupling e.g. crystal plasticity and thermo-elastoplastics
Arbitrary-Lagrangian-Eulerian (ALE) Scheme e.g. part deformation monitoring
Homogenization of microscale material properties
Industrial applications